Spectrometric and spectroscopic analysis
X-Ray photoelectron spectroscopy (XPS)
Available models:
Overview:
Xray photoelectron spectroscopy allows the analysis of surface composition. The Axis-Ultra and Escalab MKII models are multifunctional equipments coupling many characterization techniques: XPS, ISS and ASM (Axis-Ultra), XPS, SIMS, ISS and ASM (Escalab MKII).
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Auger spectroscopy
Available models:
Overview:
Equipement capable of semi-quantitative mapping of chemical composition (surface and profile). The Omicron Technologies is a model unique in the wolrd equipped with an EBDS detector in ultra-high vacuum (UHV) with a lateral resolution of 10 nm. The JOEL model allows in-situ rupture of samples with liquid helium for the analysis of the ruptured surface without contamination.
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Secondary ion mass spectrometry (TOF-SIMS)
Overview:
The time-of-flight secondary ion mass spectrometer (ION-TOF Gmbh NR-9200HR) is unique in Quebec for the analysis of chemical surface components, including fragile elements such as proteins. The resulting analyses have high mass resolution (0.0001 uma) and detection limits (ppb).
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Rutherford backscattering spectroscopy (RBS)
En bref:
The equipment is unique in Quebec for the quantitative and non-destructive analysis of atomic concentration profiles without the use of standards. Elements from carbon to uranium are detected with a sensitivity ranging from 0.001 at% to 10 at%.
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Elastic recoil detection (ERD)
Overview:
The equipement is unique in Canada for the quantitative and non-destructive atomic profile analysis without the use of standards. A large spectrum of elements is detected, from hydrogen to uranium, with a sensitivity between 0.1 at% to 1 at%.
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Fourier transform infrared spectroscopy (FT-IR)
Available models:
Overview:
FT-IR are used for the identification of organic and inorganic material and the determination of molecular structures. Examples of types of analyses: attenuated total reflectance (ATR, diamond and germanium), reflection adsorption spectroscopy (IRRAS), diffuse reflectance (DRIFTS), imaging FT-IR.
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Raman spectroscopy
Available models:
Overview:
Raman spectroscopy allows the analysis of molecular structure of organic and inorganic elements. The Invia model, unique in Quebec, is equipped with four lasers: 488 nm, 514 nm, 633 nm et 785 nm. The spectrometer permits confocal analysis, in-line focus imaging and depth profiling.
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Xray diffraction
Available models:
Overview:
Diffractometers allow, among other analyses, the study of cristalline phases, stress measurement and epitaxial deposition quality.
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Nuclear magnetic resonance (NMR)
Overview:
The Agilent-Varian Inova 600 is a hybride apparatus capable of studying both solids and liquids. It is equipped with two probes: the first, a double-resonance 4 mm probe (rotating speed up to 18 kHz); the second a triple resonance BioMass 3.2 mm probe (rotating speed up to 25 kHz).
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